1902 Image-based Analysis of Microstructures

Stephen Langer, NIST
Andrew Reid, NIST
Computing the properties of microstructures from 2D or 3D microscope images of actual materials leads to different insights into behavior than can be obtained by homogenization methods that average over microstructural details. This symposium will discuss methods and tools (such as OOF2 and OOF3D from NIST) for image-based analysis, and examples of their application.